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Matteo Perenzoni

Head of the Unit
  • Phone: 0461314533
  • FBK Povo
Short bio

Matteo Perenzoni was born in Rovereto, Trento, Italy, in 1977. He received the Laurea degree in Electronics Engineering from the University of Padova, Padova, Italy, in 2002. In 2002, he was with the University of Padova, where he worked on mixed-signal integrated circuit design for channel decoding. Since January 2004, he has been with the Center for Materials and Microsystems of the Fondazione Bruno Kessler (FBK-CMM), Trento, Italy, as a Researcher working in the Integrated Radiation and Image Sensors (IRIS) research unit. Since 2017, he became head of the IRIS research unit, leading a group of about 30 researchers, PhDs, and technicians. He has been collaborating on teaching courses of electronics and sensors for the NanoMicro Master, Trento, from 2006 to 2010. In 2011, he has been director of the bi-annual Optoelectronics and Photonics Winter School coorganized with the University of Trento. During 2014, he has been visiting research scientist in the THz Sensing Group in the Technical University of Delft. He is member of the technical program committee of the European Solid-State Circuit Conference (ESSCIRC) since 2015 and of the International Solid-State Circuit Conference (ISSCC) since 2018. His research interests include the design of advanced vision sensors for X-ray, infrared, and terahertz, as well as the modeling and optimization of analog integrated circuits: within the IRIS research unit he is responsible of the multispectral and terahertz research line.

Research interests
Image Sensors Analog Integrated Circuits Terahertz Detectors Microelectronics
Publications

All Publications

  1. Zou, Yu; Gottardi, Massimo; Lecca, Michela; Perenzoni, Matteo,
    A Low-Power VGA Vision Sensor With Embedded Event Detection for Outdoor Edge Applications,
    in «IEEE JOURNAL OF SOLID-STATE CIRCUITS»,
    2020
    , pp. 1 -
    10
  2. Perenzoni, Matteo; Massari, Nicola; Gasparini, Leonardo; Garcia, Manuel Moreno; Perenzoni, Daniele; Stoppa, David,
    in «IEEE SOLID-STATE CIRCUITS LETTERS»,
    vol. 3,
    2020
    , pp. 86 -
    89
  3. Tontini, Alessandro; Gasparini, Leonardo; Perenzoni, Matteo,
    in «SENSORS»,
    vol. 20,
    n. 18,
    2020
    , pp. 5203 -
  4. Zarghami, Majid; Gasparini, Leonardo; Parmesan, Luca; Moreno Garcia, Manuel; Stefanov, Andre; Bessire, Banz; Unternahrer, Manuel; Perenzoni, Matteo,
    A 32x 32-Pixel CMOS Imager for Quantum Optics With Per-SPAD TDC, 19.48% Fill-Factor in a 44.64-μm Pitch Reaching 1-MHz Observation Rate,
    in «IEEE JOURNAL OF SOLID-STATE CIRCUITS»,
    vol. 55,
    n. 10,
    2020
    , pp. 2819 -
    2830
  5. Massari, Nicola; Xu, Hesong; Tarolli, Alessandro; Parmesan, Luca; Perenzoni, Daniele; Colpo, Sabrina; Fronza, Nicola; Stoppa, David; Perenzoni, Matteo; Alfredo, Maglione,
    Luximos: A 768x64 900-fs Tileable Pipelined X-ray CMOS Image ray CMOS Image Sensor for Dental Imaging with 2.6 LSB/nGy Sensitivity,
    in «IEEE SOLID-STATE CIRCUITS LETTERS»,
    2020
    , pp. 1 -
    1
  6. Moreno Garcia, Manuel; Pancheri, Lucio; Perenzoni, Matteo; del Río, Rocío; Guerra Vinuesa, Óscar; Rodríguez-Vázquez, Ángel,
    in «IEEE SENSORS JOURNAL»,
    vol. 19,
    n. 14,
    2019
    , pp. 5700 -
    5709
  7. Zarghami, Majid; Gasparini, Leonardo; Perenzoni, Matteo; Pancheri, Lucio,
    in «INSTRUMENTS»,
    vol. 3,
    n. 3,
    2019
    , pp. 38 -
  8. Manuzzato, Enrico; Gasparini, Leonardo; Perenzoni, Matteo; Zou, Yu; Parmesan, Luca; Battistoni, G.; De Simoni, M.; Dong, Y.; Fischetti, M.; Gioscio, E.; Mattei, I.; Mirabelli, R.; Patera, V.; Sarti, A.; Schiavi, A.; Sciubba, A.; Valle, S. M.; Traini, G.; Marafini, M.,
    in «IEEE SOLID-STATE CIRCUITS LETTERS»,
    vol. 2,
    n. 9,
    2019
    , pp. 75 -
    78
  9. Torcheboeuf, Nicolas; Boiko, Dmitri; Mogilevtsev, Dmitri; Mikhalychev, Alexander; Stefanov, André; Bessire, Bänz; Perenzoni, Matteo; Gasparini, Leonardo; Balet, Laurent; Mitev, Valentin,
    Proceedings Volume 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology,
    2019
    , pp. 63-
    , (SPIE OPTO 2019 - Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology,
    San Francisco, California,
    2-7 February 2019)
  10. Zou, Yu; Gottardi, Massimo; Lecca, Michela; Perenzoni, Matteo,
    Proceedings of IEEE ESSCIRC,
    2019
    , (ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC),
    Cracow, Poland,
    23-26 Sept. 2019)

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