You are here

Publications

  1. Gian Franco Dalla Betta; Giorgio Umberto Pignatel; G. Verzellesi; Pierluigi Bellutti; Maurizio Boscardin; Lorenza Ferrario; Nicola Zorzi; Alfredo Maglione,
    in «MICROELECTRONICS JOURNAL»,
    vol. 29,
    n. 1-2,
    1998
    , pp. 49 -
    58
  2. Gian Franco Dalla Betta; David Stoppa; Luca Ravezzi,
    A New Current-Mode A/D Converter,
    in «ELECTRONICS LETTERS»,
    1998
    , pp. 615 -
    616
  3. Pierluigi Bellutti; Nicola Zorzi,
    Impact of High-Temperature Dry Local Oxidation on Gate Oxide Quality,
    in «JOURNAL OF THE ELECTROCHEMICAL SOCIETY»,
    vol. 145,
    n. 7,
    1998
    , pp. 2595 -
    2601
  4. Massimo Gottardi,
    PLL-based converter controls light source,
    1998
  5. Maurizio Boscardin; Luciano Bosisio; N. Carmel-Barnea; Gian Franco Dalla Betta; Lorenza Ferrario; Giorgio Umberto Pignatel; Mario Zen; Nicola Zorzi,
    First results on double-sided AC-coupled Si strip detectors,
    MIDEM’98,
    1998
    , pp. 205-
    210
    , (MIDEM’98,
    Rogavska Slatina, Slovenia,
    09/1998)
  6. David Stoppa; Gian Franco Dalla Betta; Luca Ravezzi,
    Simple High-Speed CMOS Current Comparator,
    in «ELECTRONICS LETTERS»,
    1997
    , pp. 1829 -
    1830
  7. Pierluigi Bellutti; Amos Collini; Lorenza Ferrario; Nicola Zorzi; Mario Zen,
    Gate Oxide Quality Improvement Nearby Bird`s Beak Region,
    Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    1997
    , pp. 204-
    208
    , (Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    Paris, France,
    31/08/1997 - 01/09/1997)
  8. Pierluigi Bellutti; Amos Collini; Nicola Zorzi; G. Vaccari; D. Crippa,
    MOS C-t characteristics and gate oxide quality versus bulk iron contamination in epitaxial wafers,
    Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    vol.PV 97-22,
    1997
    , pp. 209-
    217
    , (Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    Paris, France,
    31/08/1997 - 01/09/1997)
  9. M. Conti; Gian Franco Dalla Betta; S. Orcioni; Giovanni Soncini; C. Turchetti; Nicola Zorzi,
    Test structure for mismatch characterization of MOS transistors in subthreshold regime,
    Proceedings of the 1997 International Conference on Microelectronic Test Structures (ICMTS 1997),
    IEEE,
    vol.10,
    1997
    , pp. 173-
    178
    , (Proceedings of the 1997 International Conference on Microelectronic Test Structures (ICMTS 1997),
    Monterey (CA), USA,
    17/03/1997 - 20/03/1997)
  10. Massimo Gottardi,
    A CCD/CMOS Image Sensor Array wit Integrated A/D Conversion,
    Proceedings of the 1997 IEEE International Symposium on Circuits and Systems [ISCAS '97],
    1997
    , pp. 1908-
    1911

Pages