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Publications

  1. Pierluigi Bellutti; L. Eccel; Nicola Zorzi,
    The Effect of Stress Polarity on Positive Charging in Thin Gate Oxides,
    Proceedings of the `10th Workshop on Dielectrics in Microelectronics` (WoDiM99),
    1999
    , pp. 89-
    90
    , (Proceedings of the `10th Workshop on Dielectrics in Microelectronics` (WoDiM99),
    Barcelona, Spain,
    03/11/1999 - 05/11/1999)
  2. Lorenzo Gonzo; Andrea Simoni; Massimo Gottardi; D. Maschera; Jean Angelo Beraldin,
    Smart VLSI opto-sensors developments at the Istituto per la Ricerca Scientifica e Tecnologica,
    Proceedings of Canada-Italy Workshop. Heritage Applications of 3D Digital Imaging,
    1999
  3. Gian Franco Dalla Betta; Giorgio Umberto Pignatel; G. Verzellesi; Pierluigi Bellutti; Maurizio Boscardin; Lorenza Ferrario; Nicola Zorzi; Alfredo Maglione,
    in «MICROELECTRONICS JOURNAL»,
    vol. 29,
    n. 1-2,
    1998
    , pp. 49 -
    58
  4. Gian Franco Dalla Betta; David Stoppa; Luca Ravezzi,
    A New Current-Mode A/D Converter,
    in «ELECTRONICS LETTERS»,
    1998
    , pp. 615 -
    616
  5. Pierluigi Bellutti; Nicola Zorzi,
    Impact of High-Temperature Dry Local Oxidation on Gate Oxide Quality,
    in «JOURNAL OF THE ELECTROCHEMICAL SOCIETY»,
    vol. 145,
    n. 7,
    1998
    , pp. 2595 -
    2601
  6. Massimo Gottardi,
    PLL-based converter controls light source,
    1998
  7. Maurizio Boscardin; Luciano Bosisio; N. Carmel-Barnea; Gian Franco Dalla Betta; Lorenza Ferrario; Giorgio Umberto Pignatel; Mario Zen; Nicola Zorzi,
    First results on double-sided AC-coupled Si strip detectors,
    MIDEM’98,
    1998
    , pp. 205-
    210
    , (MIDEM’98,
    Rogavska Slatina, Slovenia,
    09/1998)
  8. David Stoppa; Gian Franco Dalla Betta; Luca Ravezzi,
    Simple High-Speed CMOS Current Comparator,
    in «ELECTRONICS LETTERS»,
    1997
    , pp. 1829 -
    1830
  9. Pierluigi Bellutti; Amos Collini; Lorenza Ferrario; Nicola Zorzi; Mario Zen,
    Gate Oxide Quality Improvement Nearby Bird`s Beak Region,
    Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    1997
    , pp. 204-
    208
    , (Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    Paris, France,
    31/08/1997 - 01/09/1997)
  10. Pierluigi Bellutti; Amos Collini; Nicola Zorzi; G. Vaccari; D. Crippa,
    MOS C-t characteristics and gate oxide quality versus bulk iron contamination in epitaxial wafers,
    Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    vol.PV 97-22,
    1997
    , pp. 209-
    217
    , (Proceedings of `Crystalline Defects and Contamination`, Electrochemical Society Meeting,
    Paris, France,
    31/08/1997 - 01/09/1997)

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