Publications

851. Giovanni Soncini; Mario Zen; Nicola Zorzi,
     DLTS characterization of oxide/silicon and nitroxide/silicon interfaces,
     17th Conf. on Microelectr. MIEL,
     1989
     , pp. 139-
     144
     , (17th Conf. on Microelectr. MIEL,
     Nis, Yugoslavia,
     09/05/1989 - 11/05/1989)

Pages